NSN 5961-01-086-6546

Part Details | TRANSISTOR

5961-01-086-6546 An active semiconductor device with three or more electrodes. May or may not include mounting hardware and/or heatsink. Excludes SEMICONDUCTOR DEVICE, DIODE and SEMICONDUCTOR DEVICE, THYRISTOR. For solid state devices which are responsive to visible or infrared radiant energy, see SEMICONDUCTOR DEVICE, PHOTO.

Alternate Parts: 900A5343, 900A534-3, 18432005, 1843-2005, 18432005, 1843-2005, 900A5343, 900A534-3, 5961-01-086-6546, 01-086-6546, 5961010866546, 010866546

Supply Group (FSG) NSN Assigned NIIN Item Name Code (INC)
59DEC 01, 197901-086-654620588 ( TRANSISTOR )
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 5961-01-086-6546
Part Number Cage Code Manufacturer
900A534-399167HAMILTON SUNDSTRAND CORPORATION
1843-200530043SOLID STATE DEVICES, INC.
1843-200521845SOLITRON DEVICES, INC.
900A534-383843SUNDSTRAND CORPELECTRIC POWER SYSTEMS DIV
Technical Data | NSN 5961-01-086-6546
Characteristic Specifications
SEMICONDUCTOR MATERIAL SILICON
INTERNAL CONFIGURATION JUNCTION CONTACT
VOLTAGE RATING IN VOLTS PER CHARACTERISTICCAL225.0 MAXIMUM AND CAN200.0 MAXIMUM AND CAY7.0 MAXIMUM
CURRENT RATING PER CHARACTERISTICAACAC30.00 AMPERES NOMINAL AND AACAB10.00 AMPERES NOMINAL
POWER RATING PER CHARACTERISTICATCAF150.0 WATTS
MAXIMUM OPERATING TEMP PER MEASUREMENT POINTCAZN200.0 DEG CELSIUS
INCLOSURE MATERIAL METAL
ELECTRODE INTERNALLY-ELECTRICALLY CONNECTED TO CASE COLLECTOR
JOINT ELECTRONIC DEVICE ENGINEERING COUNCIL/JEDEC/CASE OUTLINE DESIGNATIONTO-3
MOUNTING METHOD UNTHREADED HOLE
MOUNTING FACILITY QUANTITY2
TERMINAL TYPE AND QUANTITY2 PIN AND 1 CASE
OVERALL LENGTH0.450 INCHES MAXIMUM
OVERALL DIAMETER0.875 INCHES MAXIMUM
SPECIAL FEATURESJUNCTION PATTERN ARRANGEMENT: NPN
TEST DATA DOCUMENT83843-900534 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTING GENERAL TYPE DATA ON CERTAIN ENVIRONMENTAL AND PERFORMANCE REQUIREMENTS AND TEST CONDITIONS THAT ARE SHOWN AS "TYPICAL", "AVERAGE", "NOMINAL", ETC.).