NSN 5961-01-339-0375
Part Details | TRANSISTOR
5961-01-339-0375 An active semiconductor device with three or more electrodes. May or may not include mounting hardware and/or heatsink. Excludes SEMICONDUCTOR DEVICE, DIODE and SEMICONDUCTOR DEVICE, THYRISTOR. For solid state devices which are responsive to visible or infrared radiant energy, see SEMICONDUCTOR DEVICE, PHOTO.
Alternate Parts: 18530527, 1853-0527, 18530527, 1853-0527, BFQ32, BFQ-32, 5961-01-339-0375, 01-339-0375, 5961013390375, 013390375
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 59 | MAY 15, 1991 | 01-339-0375 | 20588 ( TRANSISTOR ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 5961-01-339-0375
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 1853-0527 | 28480 | HEWLETT-PACKARD COMPANYDBA HP |
| 1853-0527 | 1LQK8 | KEYSIGHT TECHNOLOGIES, INC. |
| BFQ-32 | 0LUA3 | PHILIPS COMPONENTS |
Technical Data | NSN 5961-01-339-0375
| Characteristic | Specifications |
|---|---|
| SEMICONDUCTOR MATERIAL | SILICON |
| INTERNAL CONFIGURATION | JUNCTION CONTACT |
| VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | CAB20.0 MAXIMUM |
| CURRENT RATING PER CHARACTERISTIC | BACAC75.00 MILLIAMPERES NOMINAL |
| POWER RATING PER CHARACTERISTIC | BZCAG500.0 MILLIWATTS |
| TRANSFER RATIO | BAD20.0 MINIMUM |
| MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | CAZN175.0 DEG CELSIUS |
| INCLOSURE MATERIAL | METAL |
| MOUNTING METHOD | PRESS FIT |
| TERMINAL TYPE AND QUANTITY | 3 UNINSULATED WIRE LEAD |
| OVERALL LENGTH | 0.062 INCHES NOMINAL |
| OVERALL DIAMETER | 0.187 INCHES NOMINAL |
| FUNCTION FOR WHICH DESIGNED | MICROWAVE |
| SPECIAL FEATURES | JUNCTION PATTERN ARRANGEMENT: PNP |
| END ITEM IDENTIFICATION | 6625-01-224-4440 NETWORK ANALYZER |