NSN 5961-01-444-1600
Part Details | DIODE SEMICONDUCTOR DEVICE
5961-01-444-1600 A two electrode semiconductor device having an asymmetrical voltage - current characteristic. May or may not include mounting hardware and/or heatsink. Excludes LIGHT EMITTING DIODE and SEMICONDUCTOR DEVICE,PHOTO. For items containing material such as selenium and copper oxide, see RECIFIER, METALLIC.
Alternate Parts: LO4695, 1384311, 138431-1, MX1N2981B, 5961-01-444-1600, 01-444-1600, 5961014441600, 014441600
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 59 | APR 30, 1997 | 01-444-1600 | 20589 ( SEMICONDUCTOR DEVICE, DIODE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 5961-01-444-1600
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| LO4695 | 16236 | DLA LAND AND MARITIMEDBA ENGINEERING AND TECHNICAL |
| 138431-1 | 94271 | LOCKHEED MARTIN CORPORATIONDBA LOCKHEED MARTIN |
| MX1N2981B | 12954 | MICROSEMI CORP.-SCOTTSDALEDBA MICROSEMI |
Technical Data | NSN 5961-01-444-1600
| Characteristic | Specifications |
|---|---|
| SPECIAL FEATURES | ITEM MUST COMPLY WITH REQUIREMENTS OF DEFENSE SUPPLY CENTER COLUMBUS PRODUCTION STANDARD NO.LO4695 |
| REFERENCE NUMBER DIFFERENTIATING CHARACTERISTICS | REFERENCE NUMBER DIFFERENTIATING MATERIAL WILL BE IN ACCORDANCE WITH NAVAL INVENTORY CONTROL POINT ACTIVITY HX QUALITY CONTROL. MANUFACTURING AND TESTING SPECIFICATIONS AVAILABLE AT THE DLA ICP. |
| CRITICALITY CODE JUSTIFICATION | ZZZY |