NSN 6625-00-691-6529
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-00-691-6529 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: TS3308U, TS-3308/U, 575, 6625-00-691-6529, 00-691-6529, 6625006916529, 006916529
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | JAN 01, 1963 | 00-691-6529 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-691-6529
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| TS-3308/U | 80058 | JOINT ELECTRONICS TYPE DESIGNATIONSYSTEM |
| 575 | 80009 | TEKTRONIX, INC.DBA TEKTRONIX |
Technical Data | NSN 6625-00-691-6529
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | FAULT ISOLATION |
| ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| AC VOLTAGE RATING | V105.0 AND V250.0 |
| FREQUENCY RATING | E50.0 AND E60.0 |
| PHASE | A |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| SPECIAL FEATURES | SINGLE OR REPETITIVE DISPLAYS; DIRECT COMPARISON OF TRANSISTOR CHARACTERISTICS; SELECTR CIRCUIT PARAMETERS W/FRONT PANEL CONTROLS; TOTAL DIODE MEASUREMENTS |
| SUPPLEMENTARY FEATURES | DISPLAY AREA 10X10 DIV(5/16 IN. PER DIV) |
| FUNCTIONAL CLASSIFICATION | AA-9.6 |
| FUNCTIONAL DESCRIPTION | USED TO DISPLAY DYNAMIC CHARACTERISTIC CURVES OF WIDE RANGE OF SEMICONDUCTOR DEVICES |
| REFERENCE DATA AND LITERATURE | TEKTRONIC CATALOG 1967 |
| ENTRY DATE | 78-09-01 |