NSN 6625-01-044-7748
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-044-7748 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 3490A, 3490-A, 6625-01-044-7748, 01-044-7748, 6625010447748, 010447748
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | JUL 20, 1977 | 01-044-7748 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-044-7748
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 3490-A | 60741 | TRIPLETT BLUFFTON CORPORATIONDBA LFE INSTRUMENTS |
Technical Data | NSN 6625-01-044-7748
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | POWER AND SIGNAL |
| ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| AC VOLTAGE RATING | V110.0 |
| FREQUENCY RATING | E60.0 |
| PHASE | A |
| INCLOSURE FEATURE | SINGLE ITEM W/CARRYING CASE |
| DEPTH | 15.000 INCHES NOMINAL |
| HEIGHT | 8.000 INCHES NOMINAL |
| WIDTH | 19.000 INCHES NOMINAL |
| SPECIAL FEATURES | MFG NAME-TRANSISTOR ANALYZER |
| SUPPLEMENTARY FEATURES | PORTABLE; LEAKAGE READ DOWN TO 100 NANOAMPERES; CONTINUOUS CURRENT |
| FUNCTIONAL DESCRIPTION | ALLOWS PLOTTING OF TRANSISTOR CHARACTERISTIC CURVES; ANY TYPE OF TRANSISTOR TEST |