NSN 6625-01-069-1282
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-069-1282 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: TF30, 6625-01-069-1282, 01-069-1282, 6625010691282, 010691282
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | DEC 08, 1978 | 01-069-1282 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-069-1282
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| TF30 | 33347 | SENCORE, INC. |
Technical Data | NSN 6625-01-069-1282
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | CRICKET GAIN; BETA AND TRANSCONDUCTANCE LEAKAGE |
| OPERATING TEST CAPABILITY | BETA RANGE 0 TO 500; GM RANGE 0 TO 25000 MICRO-OHMS; LEAKAGE TEST RANGE 0 TO 2500 MICROAMPS; LOSS RANGE 0 TO 80 MILLIAMPS |
| ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| AC VOLTAGE RATING | V105.0 AND V130.0 |
| PHASE | A |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| MATERIAL AND LOCATION | ST0000AFA STEEL |
| SURFACE TREATMENT | PLASTIC |
| DEPTH | 7.500 INCHES NOMINAL |
| HEIGHT | 9.750 INCHES NOMINAL |
| WIDTH | 7.500 INCHES NOMINAL |
| SUPPLEMENTARY FEATURES | MANUFACTURERS NAME: TRANSISTOR TEST SET |
| FUNCTIONAL CLASSIFICATION | AA-9.3 |