NSN 6625-01-076-7916
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-076-7916 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: AFIT3000A, 6625-01-076-7916, 01-076-7916, 6625010767916, 010767916
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | MAY 11, 1979 | 01-076-7916 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-076-7916
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| AFIT3000A | 51089 | FAIRCHILD SEMICONDUCTOR CORPPCB-TEST TESTLINE DIV |
Technical Data | NSN 6625-01-076-7916
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | INTEGRATED CIRCUIT FAULT ISOLATION |
| ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| AC VOLTAGE RATING | V115.0 |
| FREQUENCY RATING | E60.0 |
| PHASE | A |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| SPECIAL FEATURES | A MASTER LIBRARY DISC CONTAINING INDIVIDUAL TRUTH TABLE DATA FOR IC'S IN THE TTL,DTL,& CMOS LOGIC FAMILIES IS INCLUDED |
| SUPPLEMENTARY FEATURES | MANUFACTURERS NAME: DIGITAL PCB TEST SYSTEM |