NSN 6625-01-085-8037
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-085-8037 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 1005B1, 1005B-1, 1005B, HTR1005B1, HTR1005B-1, HTR 1005B, 6625-01-085-8037, 01-085-8037, 6625010858037, 010858037
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | NOV 16, 1979 | 01-085-8037 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-085-8037
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 1005B-1 | 57705 | HUNTRON INCDBA HUNTRON INSTRUMENTS |
| 1005B | 57705 | HUNTRON INCDBA HUNTRON INSTRUMENTS |
| HTR1005B-1 | 57705 | HUNTRON INCDBA HUNTRON INSTRUMENTS |
| HTR 1005B | 57705 | HUNTRON INCDBA HUNTRON INSTRUMENTS |
Technical Data | NSN 6625-01-085-8037
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | COMPARITOR FUNCTION,CIRCUIT BOARDS WITH INTEGRATED CIRCUITS OR HYBRID CIRCUITS;IN-CIRCUIT TESTING AT LOW,MEDIUM AND HIGH IMPEDANCE;CIRCUIT TESTING FOR CURRENT-LIMITED CIRCUIT PROTECTION;IN-CIRCUIT TEST OF SOLID STATE COMPONENTS;RELIABLE TESTING OF ELECTROLYTIC CAPACITORS |
| OPERATING TEST CAPABILITY | VISUAL SCOPE DISPLAY PROJECTING IMAGES INDICATING CONDITION OF A DEVICE UNDER TEST |
| ELECTRICAL POWER SOURCE RELATIONSHIP | ALTERNATE OPERATING |
| AC VOLTAGE RATING | V115.0 |
| FREQUENCY RATING | E60.0 |
| PHASE | A |
| INTERNAL BATTERY ACCOMMODATION | C |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| MATERIAL AND LOCATION | PC0000AFA PLASTIC |
| SURFACE TREATMENT | PLASTIC |
| DEPTH | 11.250 INCHES NOMINAL |
| HEIGHT | 3.375 INCHES NOMINAL |
| WIDTH | 10.000 INCHES NOMINAL |
| MAJOR COMPONENTS | TESTER,SOLID STATE;TEST PROBES AND CABLES |