NSN 6625-01-086-9639
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-086-9639 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 259C, 6625-01-086-9639, 01-086-9639, 6625010869639, 010869639
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | DEC 07, 1979 | 01-086-9639 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-086-9639
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 259C | 93346 | COBHAM ADVANCED ELECTRONIC SOLUTIONSINC. |
Technical Data | NSN 6625-01-086-9639
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | BETA OF TRANSISTOR; FORWARD TRANDUCTANCE OF FIELD-EFFECT TRANSISTOR; RESISTANCE OF TRANSISTOR OR DIODE; SHORTED DIODE; OPEN DIODE |
| ELECTRICAL POWER SOURCE RELATIONSHIP | SELF-CONTAINED |
| INTERNAL BATTERY ACCOMMODATION | B |
| INCLOSURE FEATURE | SINGLE ITEM W/CARRYING CASE |
| MATERIAL AND LOCATION | PC0000AEZ PLASTIC |
| LENGTH | 7.000 INCHES NOMINAL |
| WIDTH | 6.500 INCHES NOMINAL |
| THICKNESS | 4.500 INCHES NOMINAL |