NSN 6625-01-095-9344
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-095-9344 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 520B, 7915952, 6625-01-095-9344, 01-095-9344, 6625010959344, 010959344
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | JUN 10, 1980 | 01-095-9344 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-095-9344
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 520B | 18110 | DYNASCAN CORP |
| 7915952 | 18876 | U S ARMY AVIATION AND MISSILECOMMAND |
Technical Data | NSN 6625-01-095-9344
| Characteristic | Specifications |
|---|---|
| TEST DATA DOCUMENT | 18876-7915952 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWING) |
| END ITEM IDENTIFICATION | 4931-01-070-6788 |