NSN 6625-01-115-0395
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-115-0395 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: TRACKER 1000, HTR 1005B1S, HTR 1005B-1S, 6625-01-115-0395, 01-115-0395, 6625011150395, 011150395
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | JUN 26, 1981 | 01-115-0395 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-115-0395
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| TRACKER 1000 | 57705 | HUNTRON INCDBA HUNTRON INSTRUMENTS |
| HTR 1005B-1S | 57705 | HUNTRON INCDBA HUNTRON INSTRUMENTS |
Technical Data | NSN 6625-01-115-0395
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | IN-CIRCUIT TESTING OF COMPONENTS |
| ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| AC VOLTAGE RATING | V115.0 |
| FREQUENCY RATING | E60.0 |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| DEPTH | 286.0 MILLIMETERS NOMINAL |
| HEIGHT | 86.0 MILLIMETERS NOMINAL |
| WIDTH | 250.0 MILLIMETERS NOMINAL |
| FUNCTIONAL CLASSIFICATION | AA-9.3 |