NSN 6625-01-147-1773
Part Details | TEST PROBE
6625-01-147-1773 An item which is designed to be attached to but does not include a wire or cable. It is used in the testing of electric or electronic circuits. Electronic components such as capacitors, electron tube, resistors, semiconductor devices and the like are mounted into and included with the item. Excludes PROBE-LEAD ASSEMBLY, TEST and TEST PROBE ATTACHMENT.
Alternate Parts: RJP765RY, 6625-01-147-1773, 01-147-1773, 6625011471773, 011471773
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | FEB 11, 1983 | 01-147-1773 | 39886 ( PROBE, TEST ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-147-1773
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| RJP765RY | 51275 | ANRITSU INSTRUMENTS COMPANYDIV MBU |
Technical Data | NSN 6625-01-147-1773
| Characteristic | Specifications |
|---|---|
| OVERALL LENGTH | 7.000 INCHES NOMINAL |
| OVERALL DIAMETER | 1.500 INCHES NOMINAL |
| SPECIAL FEATURES | FLAT CONFIGURATION. 1.0 CM SQ ACTIVE AREA. 5 X 10-13J EQUIVALENT NOISE LEVEL. 2 X 10-6J MAX ENERGY. 5 MAX IRRADIANCE. 5 X 10-5W MAX AVG POWER |
| FUNCTIONAL DESCRIPTION | 1 CM SQ SILICON DETECTOR ALLOWS MEASUREMENT OF VISIBLE AND NEAR IR SIGNALS WITH ENERGIES AS LOW AS 2 X 10-13J. STD OPTION (RY) PROVIDES OPTIMIZED 1.06U RESPONSE AND IS USEFUL IN THE CHARACTERIZATION OF LASER TARGET DESIGNATORS |