NSN 6625-01-152-1697
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-152-1697 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 3110, 6625-01-152-1697, 01-152-1697, 6625011521697, 011521697
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | APR 28, 1983 | 01-152-1697 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-152-1697
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 3110 | 34160 | VU-DATA CORP |
Technical Data | NSN 6625-01-152-1697
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | IN-CIRCUIT TESTING OF COMPONENTS |
| ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| AC VOLTAGE RATING | V115.0 |
| FREQUENCY RATING | E60.0 |
| PHASE | A |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| DEPTH | 286.0 MILLIMETERS NOMINAL |
| HEIGHT | 86.0 MILLIMETERS NOMINAL |
| WIDTH | 250.0 MILLIMETERS NOMINAL |
| END ITEM IDENTIFICATION | NSN 5826-00-117-7747 CALIBRATION BENCH MOCK UP |