NSN 6625-01-201-0653
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-201-0653 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: S250, 6625-01-201-0653, 01-201-0653, 6625012010653, 012010653
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | FEB 12, 1985 | 01-201-0653 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-201-0653
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| S250 | 51511 | LUCAS/SIGNATONE CORPORATIONDBA LUCAS LABS |
Technical Data | NSN 6625-01-201-0653
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | SUBMICRON GEOMETRY OF INTEGRATED CIRCUIT CHIPS |
| ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| AC VOLTAGE RATING | V115.0 |
| FREQUENCY RATING | E60.0 |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| MAJOR COMPONENTS | MICROZOOM MICROSCOPE; S-930V FINEMOTION MICROPOSITIONER; SM-SP SPUNG LOADED PROBE TIP HOLDER; SE-TZ 5 MICRON TUNGSTEN PROBE TIP; SE-10TZ 1 MICRON TUNGSTEN PROBE TIP; S-2715 SOCKET CARD ADAPTER; S-VAC VACUUM PUMP W/10 FT. OFTUBING |