NSN 6625-01-201-2881
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-201-2881 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 2500, 6625-01-201-2881, 01-201-2881, 6625012012881, 012012881
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | FEB 14, 1985 | 01-201-2881 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-201-2881
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 2500 | 64622 | IMCS CORP |
Technical Data | NSN 6625-01-201-2881
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | ELECTROSTATIC DISCHARGE |
| ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| AC VOLTAGE RATING | V110.0 |
| FREQUENCY RATING | E50.0 AND E60.0 |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| DEPTH | 24.000 INCHES NOMINAL |
| HEIGHT | 10.000 INCHES NOMINAL |
| WIDTH | 14.000 INCHES NOMINAL |
| SPECIAL FEATURES | PROGRAMMABLE PULSE NETWORK |
| SUPPLEMENTARY FEATURES | SHIPPING WEIGHT 18 LBS.; 0-15,000V CONTINUOUSLY ADJUSTABLE HIGH VOLTAGE; 4-1/2 DIGIT DISPLAY; 1-128 PINS; 1-99 AUTO PULSES |