NSN 6625-01-216-3258
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-216-3258 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: HTR1005B1ES, HTR1005B-1ES, 6625-01-216-3258, 01-216-3258, 6625012163258, 012163258
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | SEP 07, 1985 | 01-216-3258 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-216-3258
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| HTR1005B-1ES | 57705 | HUNTRON INCDBA HUNTRON INSTRUMENTS |
Technical Data | NSN 6625-01-216-3258
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | IN-CIRCUIT TESTING OF COMPONETS |
| ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| AC VOLTAGE RATING | V220.00 |
| FREQUENCY RATING | E50.0 AND E60.0 |
| INCLOSURE FEATURE | SINGLE ITEM W/CARRYING CASE |
| DEPTH | 286.0 MILLIMETERS NOMINAL |
| HEIGHT | 86.0 MILLIMETERS NOMINAL |
| WIDTH | 250.0 MILLIMETERS NOMINAL |