NSN 6625-01-230-9524
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-230-9524 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 8717B, 8717B, 6625-01-230-9524, 01-230-9524, 6625012309524, 012309524
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | APR 20, 1986 | 01-230-9524 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-230-9524
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 8717B | 28480 | HEWLETT-PACKARD COMPANYDBA HP |
| 8717B | 1LQK8 | KEYSIGHT TECHNOLOGIES, INC. |
Technical Data | NSN 6625-01-230-9524
| Characteristic | Specifications |
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