NSN 6625-01-239-4638
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-239-4638 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 2000A, 2000, 4036983, 403-6983, 6625-01-239-4638, 01-239-4638, 6625012394638, 012394638
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | AUG 29, 1986 | 01-239-4638 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-239-4638
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 2000A | 57705 | HUNTRON INCDBA HUNTRON INSTRUMENTS |
| 2000 | 57705 | HUNTRON INCDBA HUNTRON INSTRUMENTS |
| 403-6983 | A486G | NIMIKKEISTOKESKUS NCB FINLAND |
Technical Data | NSN 6625-01-239-4638
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | LEAKAGE,BONDING,FAILURE,SHORTS,OPENS |
| ELECTRICAL POWER SOURCE RELATIONSHIP | ALTERNATE OPERATING |
| FREQUENCY RATING | E50.0 AND E2000.0 |
| INCLOSURE FEATURE | SINGLE ITEM W/CARRYING CASE |
| DEPTH | 11.000 INCHES NOMINAL |
| HEIGHT | 4.000 INCHES NOMINAL |
| WIDTH | 9.000 INCHES NOMINAL |
| SUPPLEMENTARY FEATURES | IMPEDANCE RANGES: OPEN CIRCUIT VOLTAGE 10VP,15VP,20VP,60VP; SHORT CIRCUIT CURRENT 135MARMS,9.0MARMS,0.6MARMS |