NSN 6625-01-256-6502
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-256-6502 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 17329734, 1732-9734, 6625-01-256-6502, 01-256-6502, 6625012566502, 012566502
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | JUN 07, 1987 | 01-256-6502 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-256-6502
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 1732-9734 | 24655 | GENRAD INC |
Technical Data | NSN 6625-01-256-6502
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | TESTS ON SINGLE TEST HEAD DIGITAL IC'S |
| ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| AC VOLTAGE RATING | V87.0 AND V127.0 AND V174.0 AND V250.0 |
| FREQUENCY RATING | E48.0 AND E63.0 |
| PHASE | A |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| SPECIAL FEATURES | DISPLAY BOTH LED AND VIDEO; INCLUDES KEYBOARD AND MASS STORAGE CAPABILITY; RS232 OR 1EEE-488 INTERFACE; CONSISTS OF PROGRAM DISPLAY UNIT AND PIN ELECTRONICS UNIT |
| SUPPLEMENTARY FEATURES | MANUFACTURERS NAME: DIGITAL IC TEST SYSTEM |