NSN 6625-01-257-5258
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-257-5258 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 17319700, 1731-9700, 6625-01-257-5258, 01-257-5258, 6625012575258, 012575258
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | JUN 20, 1987 | 01-257-5258 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-257-5258
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 1731-9700 | 24655 | GENRAD INC |
Technical Data | NSN 6625-01-257-5258
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | MICROCOMPUTER CONTROLLED RAM BASED TEST SYSTEM FOR HIGH THROUGHPUT TESTING OF THE FULL RANGE OF LINEAR DEVICES |
| ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| AC VOLTAGE RATING | V110.0 AND V125.0 AND V216.0 AND V250.0 |
| FREQUENCY RATING | E50.0 AND E60.0 |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| DEPTH | 25.000 INCHES NOMINAL |
| HEIGHT | 12.500 INCHES NOMINAL |
| WIDTH | 19.000 INCHES NOMINAL |
| SPECIAL FEATURES | DISPLAY INCLUDES BOTH PASS/FAIL LED AND A RANGE OF VIDEO DISPLAY MODES; INCLUDES KEYBOARD AND MASS STORAGE; RS232 AND IEEE-488 INTERFACES |
| SUPPLEMENTARY FEATURES | MANUFACTURERS NAME: LINEAR IC TEST SYSTEM |