NSN 6625-01-259-8161
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-259-8161 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 4191A, 4191A, 6625-01-259-8161, 01-259-8161, 6625012598161, 012598161
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | JUL 22, 1987 | 01-259-8161 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-259-8161
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 4191A | 28480 | HEWLETT-PACKARD COMPANYDBA HP |
| 4191A | 1LQK8 | KEYSIGHT TECHNOLOGIES, INC. |
Technical Data | NSN 6625-01-259-8161
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | RF IMPEDANCE; SEMICONDUCTOR MEASUREMENT |
| ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| AC VOLTAGE RATING | V100.0 AND V240.0 |
| FREQUENCY RATING | E48.0 AND E66.0 |
| PHASE | B |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| DEPTH | 574.0 MILLIMETERS NOMINAL |
| HEIGHT | 230.0 MILLIMETERS NOMINAL |
| WIDTH | 425.5 MILLIMETERS NOMINAL |
| SPECIAL FEATURES | OPR TEMP 0 - 55 DEG C;TYPE OF TESTS:IZI-THEDA,IYI-THEDA,IRI-THEDA R-X,G-B,IX-IY,L-R X G X D X Q C-R X G X D X Q;-40 TO +40 VDC BIAS INTERNAL AND EXTERNAL;+.1 AMPS DC MAX FOR DC BIAS;INTERNAL,EXTERNAL,OR MANUAL TRIGGER |
| FUNCTIONAL DESCRIPTION | PERFORMS ANALYSIS OF 14 PARAMETERS WITH 4.5 DIGIT RESOLUTION ACROSS A 1 TO 1000 MHZ FREQ RANGE |