NSN 6625-01-263-4525
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-263-4525 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: SERIES10, 6625-01-263-4525, 01-263-4525, 6625012634525, 012634525
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | SEP 15, 1987 | 01-263-4525 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-263-4525
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| SERIES10 | 25677 | FAIRCHILD SEMICONDUCTOR CORPTEST SYSTEMS GROUP |
Technical Data | NSN 6625-01-263-4525
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | PULSE,TIME INTERVAL,CURRENT,VOLTAGE |
| SPECIAL FEATURES | VIDEO KEYBOARD TERMINAL; PORM 2 PCT ACURACY; POWER SUPPLY M7.0 V-P15.0 V,TEST RATE 10-20 MHZ; CLOCK RATE 30 MHZ; M10 V-P20 V,300 MA POWER SUPPLY;CAPACITANCE 15-20 PF; LOAD CURRENT: DCPORM 20 MA,AC PORM 80 MA; MAX CPU MEMORY 256K ECC; FLOPPY DISC; OUTPUT MAG TAPE/LINE PRINTER; STORAGE 200 KBYTES;IEEE 488 BUSS |