NSN 6625-01-274-4662
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-274-4662 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: TRACKER2000HSR410, TRACKER2000-HSR410, 6625-01-274-4662, 01-274-4662, 6625012744662, 012744662
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | MAR 09, 1988 | 01-274-4662 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-274-4662
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| TRACKER2000-HSR410 | 57705 | HUNTRON INCDBA HUNTRON INSTRUMENTS |
Technical Data | NSN 6625-01-274-4662
| Characteristic | Specifications |
|---|---|
| END ITEM IDENTIFICATION | GPETE PROGRAM |