NSN 6625-01-294-2015
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-294-2015 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 370A1, 6625-01-294-2015, 01-294-2015, 6625012942015, 012942015
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | FEB 11, 1989 | 01-294-2015 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-294-2015
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 370A1 | 80009 | TEKTRONIX, INC.DBA TEKTRONIX |
Technical Data | NSN 6625-01-294-2015
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | TROUBLESHOOTING |
| ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| AC VOLTAGE RATING | V220.0 |
| FREQUENCY RATING | E50.0 |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| DEPTH | 25.100 INCHES NOMINAL |
| HEIGHT | 13.100 INCHES NOMINAL |
| WIDTH | 16.900 INCHES NOMINAL |