NSN 6625-01-297-0967
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-297-0967 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 2397840, 2397840, 6625-01-297-0967, 01-297-0967, 6625012970967, 012970967
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | MAR 29, 1989 | 01-297-0967 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-297-0967
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 2397840 | 49671 | LOCKHEED MARTIN CORPORATIONDBA LOCKHEED MARTIN |
| 2397840 | 16331 | LOCKHEED MARTIN CORPORATIONDBA LOCKHEED MARTIN |
Technical Data | NSN 6625-01-297-0967
| Characteristic | Specifications |
|---|---|
| END ITEM IDENTIFICATION | TEST SET VTM/TRANDUCER KIT ASSY |