NSN 6625-01-300-0083
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-300-0083 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 2074A, 6625-01-300-0083, 01-300-0083, 6625013000083, 013000083
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | MAY 09, 1989 | 01-300-0083 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-300-0083
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 2074A | 5Z365 | PACIFIC AMUSEMENT ENTERPRISEDBA BUGTRAP INSTRUMENTATION |
Technical Data | NSN 6625-01-300-0083
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | LOGIC COMPARATOR |
| OPERATING TEST CAPABILITY | CONTINUOUS,10MHZ MAX. |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |