NSN 6625-01-311-9110
Part Details | ELECTRONIC SYSTEMS TEST SET GROUP
6625-01-311-9110 A test set specifically designed for use in making examinations and providing discrete evaluations of the overall performance of a system(s) or subsystem. A system consists of two or more sets, a subsystem is grouping of two or more sets.
Alternate Parts: 3789B, 3789B, 6625-01-311-9110, 01-311-9110, 6625013119110, 013119110
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | DEC 06, 1989 | 01-311-9110 | 22957 ( TEST SET GROUP, ELECTRONIC SYSTEMS ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-311-9110
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 3789B | 28480 | HEWLETT-PACKARD COMPANYDBA HP |
| 3789B | 1LQK8 | KEYSIGHT TECHNOLOGIES, INC. |
Technical Data | NSN 6625-01-311-9110
| Characteristic | Specifications |
|---|---|
| END ITEM NAME | GPETE PROGRAM |
| SPECIAL FEATURES | TEST SET OFFERS COMPREHENSIVE ERROR MEASURING CAPABILITY FO DIGITAL TRANSMISSION.DESIGNED TO MONITOR B3ZS CODED DATA FOR BIT,PARITY,FRAME AND CODE ERRORS AT DS3 LEVEL AND TO DETECT BIT,FRAME AND CRC ERRORS AT DS1 LEVEL.UNITIS MICROPROCESSOR BASED.RESULTS LOGGED TO AN EXTERNAL PRINTER,INTERNAL PRINTER OR INTERNAL DISC DRIVE |