NSN 6625-01-316-6512
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-316-6512 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 1000, HTR1000, 6625-01-316-6512, 01-316-6512, 6625013166512, 013166512
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | MAR 13, 1990 | 01-316-6512 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-316-6512
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 1000 | 57705 | HUNTRON INCDBA HUNTRON INSTRUMENTS |
| HTR1000 | 57705 | HUNTRON INCDBA HUNTRON INSTRUMENTS |
Technical Data | NSN 6625-01-316-6512
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | WILL DETECT LEAKAGE,BONDING PROBLEMS,SHORTS,OPENS AND UNUSUAL FAILURE MODES |
| ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| AC VOLTAGE RATING | V115.0 AND V230.0 |
| HEIGHT | 4.000 INCHES NOMINAL |
| LENGTH | 11.000 INCHES NOMINAL |
| WIDTH | 9.000 INCHES NOMINAL |