NSN 6625-01-325-3672
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-325-3672 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 5100DS990315, 5100DS/99-0315, 5100DS990312, 5100DS/99-0312, TRACKER5100DS, 6625-01-325-3672, 01-325-3672, 6625013253672, 013253672
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | SEP 02, 1990 | 01-325-3672 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-325-3672
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 5100DS/99-0315 | 57705 | HUNTRON INCDBA HUNTRON INSTRUMENTS |
| 5100DS/99-0312 | 57705 | HUNTRON INCDBA HUNTRON INSTRUMENTS |
| TRACKER5100DS | 57705 | HUNTRON INCDBA HUNTRON INSTRUMENTS |
Technical Data | NSN 6625-01-325-3672
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | CURRENT VS VOLTAGE SIGNATURE ANALYSIS |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| HEIGHT | 6.300 INCHES NOMINAL |
| LENGTH | 20.300 INCHES NOMINAL |
| WIDTH | 12.000 INCHES NOMINAL |
| END ITEM IDENTIFICATION | GPETE |