NSN 6625-01-327-0152
Part Details | ELECTRONIC SYSTEMS TEST SET GROUP
6625-01-327-0152 A test set specifically designed for use in making examinations and providing discrete evaluations of the overall performance of a system(s) or subsystem. A system consists of two or more sets, a subsystem is grouping of two or more sets.
Alternate Parts: OQ452U, OQ-452/U, C5117754, C5117754, 6625-01-327-0152, 01-327-0152, 6625013270152, 013270152
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | OCT 05, 1990 | 01-327-0152 | 22957 ( TEST SET GROUP, ELECTRONIC SYSTEMS ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-327-0152
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| OQ-452/U | 80058 | JOINT ELECTRONICS TYPE DESIGNATIONSYSTEM |
| C5117754 | 80063 | US ARMY COMMUNICATIONS &ELECTRONICS MATERIEL READINESS |
| C5117754 | 57957 | US ARMY ELECTRONIC WARFARELABORATORY |
Technical Data | NSN 6625-01-327-0152
| Characteristic | Specifications |
|---|---|
| USAGE LOCATION | COMMUNICATIONS ZONE |
| COMPONENT QUANTITY | 3 |
| COMPONENT DOCUMENT ORIGIN | INDUSTRIAL |
| DOCUMENT SOURCE | 57957 |
| DOCUMENT TYPE | ENGINEERING DRAWING |
| END ITEM NAME | ADVANCED QUICK LOOK SUBSYSTEM |
| END ITEM SOURCE | 57957 |
| END ITEM IDENTIFICATION | ADVANCED QUICK LOOK SUBSYSTEM,UTL-1100 |
| JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM NAME | TEST SET GROUP,ELECTRONIC SYSTEM |
| JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM TYPE NUMBER | OQ-452/U |
| FUNCTIONAL DESCRIPTION | SELECTS AND RUNS DIAGNOSTIC PROGRAMS FOR CHECKING AQL AIRBORNE SUBSYSTEM EQUIPMENT AND BUILDS BUILT- IN-TEST FILES |