NSN 6625-01-348-9634
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-348-9634 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 5100DS, 6625-01-348-9634, 01-348-9634, 6625013489634, 013489634
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | NOV 19, 1991 | 01-348-9634 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-348-9634
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 5100DS | 57705 | HUNTRON INCDBA HUNTRON INSTRUMENTS |
Technical Data | NSN 6625-01-348-9634
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | ANALOG AND DIGITAL COMPONENTS |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |