NSN 6625-01-355-2947
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-355-2947 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 5080011890, 508-00118-90, 0990013506, 099-00135-06, 6625-01-355-2947, 01-355-2947, 6625013552947, 013552947
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | MAR 13, 1992 | 01-355-2947 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-355-2947
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 508-00118-90 | 32770 | KATO ENGINEERING INC. |
| 099-00135-06 | 32770 | KATO ENGINEERING INC. |
Technical Data | NSN 6625-01-355-2947
| Characteristic | Specifications |
|---|---|
| END ITEM IDENTIFICATION | REDUNDANT VOLTAGE REGULATOR |