NSN 6625-01-358-3159
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-358-3159 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 5100DS990314, 5100DS/99-0314, 6625-01-358-3159, 01-358-3159, 6625013583159, 013583159
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | MAY 12, 1992 | 01-358-3159 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-358-3159
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 5100DS/99-0314 | 57705 | HUNTRON INCDBA HUNTRON INSTRUMENTS |
Technical Data | NSN 6625-01-358-3159
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | BOLTAGE VS CURRENT |
| ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| AC VOLTAGE RATING | V115.0 AND V230.0 |
| FREQUENCY RATING | E60.0 |