NSN 6625-01-364-8177
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-364-8177 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: LTC906, LTC-906, 6625-01-364-8177, 01-364-8177, 6625013648177, 013648177
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | SEP 25, 1992 | 01-364-8177 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-364-8177
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| LTC-906 | 53714 | LEADER INSTRUMENTS CORPORATION |
Technical Data | NSN 6625-01-364-8177
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | MULTI-PURPOSE TRANSISTOR CHECKER |
| OPERATING TEST CAPABILITY | PORM 2 VOLTS 10 PERCENT DUTY CYCLE |
| ELECTRICAL POWER SOURCE RELATIONSHIP | ALTERNATE OPERATING |
| AC VOLTAGE RATING | V125.0 |
| DC VOLTAGE RATING | V8.0 AND V10.0 |
| INTERNAL BATTERY ACCOMMODATION | B |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |