NSN 6625-01-378-8012

Part Details | ELECTRONIC CIRCUIT PLUG-IN UNIT TEST SET

6625-01-378-8012 A test set specifically designed for use in making examination of plug-in items, commonly referred to as modules or potted components, that are part of an electronic equipment. These plug-in items are inclosed and sealed in a case, and are provided with plug-type connectors for insertion into or removal from the component or equipment of which they are a part. It includes items that test circuit cards, that may or may not be encased and/or sealed, used with electronic computers. Excludes TEST SET (1), ELECTRON TUBE and TEST SET, VIBRATOR.

Alternate Parts: RP388, 6625-01-378-8012, 01-378-8012, 6625013788012, 013788012

Supply Group (FSG) NSN Assigned NIIN Item Name Code (INC)
66AUG 21, 199301-378-801261200 ( TEST SET, ELECTRONIC CIRCUIT PLUG-IN UNIT )
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-378-8012
Part Number Cage Code Manufacturer
RP38857705HUNTRON INCDBA HUNTRON INSTRUMENTS
Technical Data | NSN 6625-01-378-8012
Characteristic Specifications
TEST TYPE FOR WHICH DESIGNEDCOMPUTER CONTROLLED ELECTROMECHANICAL PROBE PERMITS STORAGE OF ANALOG SIGNATURES OF PCB'S/AUTOMATES PCB TROUBLESHOOTING
ELECTRICAL POWER SOURCE RELATIONSHIP OPERATING
AC VOLTAGE RATINGJA110.0$JA230.0 VOLTS
FREQUENCY RATINGE60.0
PHASEA
INCLOSURE FEATURE SINGLE ITEM W/HOUSING
HEIGHT17.000 INCHES NOMINAL
LENGTH26.000 INCHES NOMINAL
WIDTH23.000 INCHES NOMINAL
SPECIAL FEATURESROBOTIC PROBER
END ITEM IDENTIFICATIONHUNTRON 5100DS TRACKER
SUPPLEMENTARY FEATURESPROBE SPEED 5 IN. PER SEC OR 12.5CM PER SEC; ACCURACY PORM 4 MILS; MIN RESOLUTION 2 MILS; MAX Z TRAVEL 3 IN. REPEATABILITY 2 MILS OVER 12 IN. OF TRAVEL; BOARD UNDER TEST MAX SIZE 14 IN.BY 14 IN.; TEST TIME FOR BOARD WITH 5029-PIN IC'S UNDER 10 MINUTES
FUNCTIONAL DESCRIPTIONIDENTIFIES TEST POINT LOCATIONS, STORES SIGNATURES OF GOOD COMPONENTS, AND AUTOMATICALLY COMPARES PCB SIGNATURE W/ SIGNATURES STORED ON HARD DRIVE
RELATIONSHIP TO SIMILAR EQUIPMENTMOUNTS OVER THE BODY OF A HUNTRON5100DS SEMICONDUCTOR TEST SET 6625-01-348-9634