NSN 6625-01-380-3727
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-380-3727 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: R4000A, R-4000A, 6625-01-380-3727, 01-380-3727, 6625013803727, 013803727
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | SEP 17, 1993 | 01-380-3727 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-380-3727
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| R-4000A | 34344 | MOTOROLA, INC.U.S. FEDERAL GOVERNMENT MARKETS DIVI |
Technical Data | NSN 6625-01-380-3727
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | IMPEDANCE RANGE: 100K,10K,1K,AND 100 OHMS; TEST FREQUENCIES: 60,2000 HZ SINEWAVE |
| AC VOLTAGE RATING | V85.0 AND V250.0 |
| FREQUENCY RATING | E50.0 AND E60.0 |
| PHASE | A |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| DEPTH | 12.250 INCHES NOMINAL |
| HEIGHT | 3.000 INCHES NOMINAL |
| WIDTH | 12.250 INCHES NOMINAL |
| SPECIAL FEATURES | UNIT REQUIRES IBM COMPATIBLE COMPTER AND MONITOR; PROBE INPUTS: 2 BANANA JACKS AND 1 BNC CONNECTOR; SCANNER INPUTS: 16,30,40, AND 64 INPUT CONNECTIONS; RS232 INTERFACE AT 9600 BAUD; DATABASE MANAGEMENT SYSTEM FOR FAILURE HISTORY AND STATISTICAL REPORTS |
| FUNCTIONAL DESCRIPTION | GENERAL PURPOSE TROUBLESHOOTING SYSTEM DESIGNED TO TEST A VARIETY OF ELECTRONIC CIRCUITS USING MENU DRIVEN SOFTWARE |