NSN 6625-01-399-2299
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-399-2299 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 2000BHSR410, 2000B-HSR410, 6625-01-399-2299, 01-399-2299, 6625013992299, 013992299
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | NOV 18, 1994 | 01-399-2299 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-399-2299
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 2000B-HSR410 | 57705 | HUNTRON INCDBA HUNTRON INSTRUMENTS |
Technical Data | NSN 6625-01-399-2299
| Characteristic | Specifications |
|---|---|
| END ITEM IDENTIFICATION | GPETE PROGRAM |