NSN 6625-01-419-8132
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-419-8132 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 370A1P, 370A-1P, 3701P, 370-1P, 370A1P, 370A-1P, 6625-01-419-8132, 01-419-8132, 6625014198132, 014198132
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | SEP 29, 1995 | 01-419-8132 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-419-8132
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 370A-1P | 1T110 | DATAWARE ELECTRONICS CORPSUB OF DATAWARE SYSTEMS LEASE INC |
| 370-1P | 1T110 | DATAWARE ELECTRONICS CORPSUB OF DATAWARE SYSTEMS LEASE INC |
| 370A-1P | 80009 | TEKTRONIX, INC.DBA TEKTRONIX |
Technical Data | NSN 6625-01-419-8132
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | PARAMETER CHARACTIZATION OF SEMICONDUCTOR DEVICES |
| INCLOSURE FEATURE | MULTIPLE ITEM W/HOUSING |
| END ITEM IDENTIFICATION | COMMON TEST EQUIPMENT |
| PURCHASE DESCRIPTION IDENTIFICATION | 1T110CONTRACT/F41608-94-C-0785 |