NSN 6625-01-433-4400
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-433-4400 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 370A, 6625-01-433-4400, 01-433-4400, 6625014334400, 014334400
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | JUN 28, 1996 | 01-433-4400 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-433-4400
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 370A | 80009 | TEKTRONIX, INC.DBA TEKTRONIX |
Technical Data | NSN 6625-01-433-4400
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | PARAMETRIC CHARACTERIZATION OF SEMICONDUCTORS |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| SPECIAL FEATURES | 3.5 INCH MS-DOS COMPATIBLE DISK STORAGE; 16V, 80V, 400V, 2000V RANGES |