NSN 6625-01-451-1404
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-451-1404 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: PROTRACK I MODEL 10, 6625-01-451-1404, 01-451-1404, 6625014511404, 014511404
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | DEC 05, 1997 | 01-451-1404 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-451-1404
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| PROTRACK I MODEL 10 | 57705 | HUNTRON INCDBA HUNTRON INSTRUMENTS |
Technical Data | NSN 6625-01-451-1404
| Characteristic | Specifications |
|---|---|
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |