NSN 6625-01-458-1372
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-458-1372 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 990224, 99-0224, 6625-01-458-1372, 01-458-1372, 6625014581372, 014581372
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | AUG 14, 1998 | 01-458-1372 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-458-1372
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 99-0224 | 57705 | HUNTRON INCDBA HUNTRON INSTRUMENTS |
Technical Data | NSN 6625-01-458-1372
| Characteristic | Specifications |
|---|---|
| SPECIAL FEATURES | 230V OPERATION |