NSN 6625-01-481-1988
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-481-1988 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 990370, 99-0370, 990364, 99-0364, 6625-01-481-1988, 01-481-1988, 6625014811988, 014811988
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | DEC 21, 2000 | 01-481-1988 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-481-1988
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 99-0370 | 57705 | HUNTRON INCDBA HUNTRON INSTRUMENTS |
| 99-0364 | 57705 | HUNTRON INCDBA HUNTRON INSTRUMENTS |
Technical Data | NSN 6625-01-481-1988
| Characteristic | Specifications |
|---|---|
| SPECIAL FEATURES | ITEMS ARE BEING CODED AS CRITICAL TO INSURE SOURCE INSPECTION WILL BE PERFORMED AT THE POINT OF MANUFACTURE, PRIOR TO MATERIAL RECEIPT BY THE US NAVY OR OTHER DOD COMPONENTS. THESE ITEMS ARE PIECE PARTS OR END ITEMS IN SUPPORT OF VITAL MILITARY HARDWARE NECESSARY TO SUSTAIN THE SUCCESSFUL MISSION OF THE SHIPS, SUBMARINES, AND SHORE STATIONS OF THE US NAVY. CRITICAL FEATURES INCLUDING, BUT NOT LIMITED TO, DIMENSIONS, TOLERANCES/CLEARANCES, ELECTRONIC CHARACTERISTICS, AND METALLURGICAL PROPERTIES WILL BESPECIFIED FOR GOVERNMENT Q AR (QUALITY ASSURANCE REPRESENTATIVES) TO INSURE THE HIGHEST POSSIBLE DEGREE OF QUALITY AND RELIABILITY OF THESE PARTS BEING DELIVERED UNDER NAVICP CONTRACTS |
| CRITICALITY CODE JUSTIFICATION | FEAT |