NSN 6625-01-511-8080
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-511-8080 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 401001B, 4010-01-B, 6625-01-511-8080, 01-511-8080, 6625015118080, 015118080
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | AUG 18, 2003 | 01-511-8080 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-511-8080
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 4010-01-B | 32997 | BOURNS, INC. |
Technical Data | NSN 6625-01-511-8080
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | CLAMPING VOLTAGE AND DC BREAKDOWN VOLTAGE |
| INTERNAL BATTERY ACCOMMODATION | B |
| INCLOSURE FEATURE | SINGLE ITEM W/CARRYING CASE |
| HEIGHT | 1.750 INCHES NOMINAL |
| LENGTH | 6.850 INCHES NOMINAL |
| WIDTH | 4.900 INCHES NOMINAL |
| SPECIAL FEATURES | AKA SURGE PROTECTOR TEST SET |
| END ITEM IDENTIFICATION | TEST EQUIPMENT (TEST) |