NSN 6625-01-527-4507

Part Details | SEMICONDUCTOR DEVICE TEST SET

6625-01-527-4507 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Alternate Parts: 990375, 99-0375, 6625-01-527-4507, 01-527-4507, 6625015274507, 015274507

Supply Group (FSG) NSN Assigned NIIN Item Name Code (INC)
66FEB 02, 200501-527-450725006 ( TEST SET, SEMICONDUCTOR DEVICE )
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-527-4507
Part Number Cage Code Manufacturer
99-037557705HUNTRON INCDBA HUNTRON INSTRUMENTS
Technical Data | NSN 6625-01-527-4507
Characteristic Specifications
TEST TYPE FOR WHICH DESIGNEDPOWER-OFF; LOW VOLTAGE LOGIC CIRCUITRY
OPERATING TEST CAPABILITY5 TEST FREQUENCIES 20,50,60,200,2000 HZ
ELECTRICAL POWER SOURCE RELATIONSHIP OPERATING
AC VOLTAGE RATINGJB115.0$JC230.0 VOLTS
FREQUENCY RATINGE50.0 AND E60.0
PHASEA
INTERNAL BATTERY ACCOMMODATIONC
INCLOSURE FEATURE SINGLE ITEM W/HOUSING
DEPTH10.800 INCHES NOMINAL
HEIGHT4.500 INCHES NOMINAL
WIDTH11.500 INCHES NOMINAL
MAJOR COMPONENTSTRACKER; MICROPROBES; COMMON TEST LEADS; 20 AND 40 PIN DIP CLIPS; BLUE CLIP LEAD; POWER CORD; INSTRUCTION CD
SPECIAL FEATURES6 PEAK VOLTAGES 200 MV, 3,5,10,15,20 VOLTS; RESISTANCE 10,100 OHMS AND 1,10,AND 100 KOHMS; 2 CHANNEL; SCAN MANUAL OR AUTOMATIC; POWER 40 WATTS; COLOR LCD; WEIGHT 6 LBS; OPERATING TEMP IS 32 TO 104 DEGF