NSN 6625-01-529-5140

Part Details | SEMICONDUCTOR DEVICE TEST SET

6625-01-529-5140 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Alternate Parts: 990381, 99-0381, 2700S MIL, 6625-01-529-5140, 01-529-5140, 6625015295140, 015295140

Supply Group (FSG) NSN Assigned NIIN Item Name Code (INC)
66APR 20, 200501-529-514025006 ( TEST SET, SEMICONDUCTOR DEVICE )
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-529-5140
Part Number Cage Code Manufacturer
99-038157705HUNTRON INCDBA HUNTRON INSTRUMENTS
2700S MIL57705HUNTRON INCDBA HUNTRON INSTRUMENTS
Technical Data | NSN 6625-01-529-5140
Characteristic Specifications
TEST TYPE FOR WHICH DESIGNEDCIRCUIT CARD ASSEMBLY
AC VOLTAGE RATINGV115.0 AND V230.0
FREQUENCY RATINGE50.0 AND E60.0
DC VOLTAGE RATINGV0.0 AND V5.0
INCLOSURE FEATURE SINGLE ITEM W/CARRYING CASE
LENGTH11.500 INCHES NOMINAL
SPECIAL FEATURESWAVE FORM: SINE WAVE. CHANNELS (2), 40 PINS/CHANNEL
END ITEM IDENTIFICATIONGPETE
TYPE/MODEL DESIGNATION2700S
PART NAME ASSIGNED BY CONTROLLING AGENCYHUNTER TRACKER