NSN 6625-01-553-8850
Part Details | ELECTRONIC SYSTEMS TEST SET GROUP
6625-01-553-8850 A test set specifically designed for use in making examinations and providing discrete evaluations of the overall performance of a system(s) or subsystem. A system consists of two or more sets, a subsystem is grouping of two or more sets.
Alternate Parts: OQ567TAS, OQ-567/TAS, 32252662, 3225266-2, 6625-01-553-8850, 01-553-8850, 6625015538850, 015538850
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | JUL 27, 2007 | 01-553-8850 | 22957 ( TEST SET GROUP, ELECTRONIC SYSTEMS ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-553-8850
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| OQ-567/TAS | 80058 | JOINT ELECTRONICS TYPE DESIGNATIONSYSTEM |
| 3225266-2 | 96214 | RAYTHEON COMPANYDBA RAYTHEON |
Technical Data | NSN 6625-01-553-8850
| Characteristic | Specifications |
|---|