NSN 6625-01-558-1794
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-558-1794 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 2800, 2700, 6625-01-558-1794, 01-558-1794, 6625015581794, 015581794
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | NOV 01, 2007 | 01-558-1794 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-558-1794
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 2800 | 57705 | HUNTRON INCDBA HUNTRON INSTRUMENTS |
| 2700 | 57705 | HUNTRON INCDBA HUNTRON INSTRUMENTS |
Technical Data | NSN 6625-01-558-1794
| Characteristic | Specifications |
|---|---|
| END ITEM IDENTIFICATION | SEMI-CONDUCTOR DEVICE |
| PART NAME ASSIGNED BY CONTROLLING AGENCY | TEST SET, SEMI-CONDUCTOR DEVICE |