NSN 6625-01-577-7189
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-577-7189 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: MILHDBK300(ATS), MIL-HDBK-300(ATS), PD09WRGBEC24, 6625-01-577-7189, 01-577-7189, 6625015777189, 015777189
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | SEP 15, 2009 | 01-577-7189 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-577-7189
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| MIL-HDBK-300(ATS) | 1HBK1 | MIL-HDBK-300HQ AFMC-LGIS |
| PD09WRGBEC24 | 98752 | WARNER ROBINS AIR LOGISTICS CENTER |
Technical Data | NSN 6625-01-577-7189
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | IN-CIRCUIT ELECTRONIC COMPONENT TESTING |
| ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| AC VOLTAGE RATING | JA110.0$JA240.0 VOLTS |
| FREQUENCY RATING | E50.0 AND E400.0 |
| PHASE | A |
| INTERNAL BATTERY ACCOMMODATION | C |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| MAJOR COMPONENTS | TEST SET; PAIR MICROPROBES; COMMON TEST LEADS; SHROUDED TEST LEAD; POWER CORD; CD MANUAL |
| ACCESSORY COMPONENT QUANTITY | 5 |
| SPECIAL FEATURES | MEETS MIL-PRF-28800 CLASS 3 |
| FUNCTIONAL CLASSIFICATION | AA-9.6 |
| FUNCTIONAL DESCRIPTION | USED TO IN-CIRCUIT TEST SEMICONDUCTOR COMPONENTS |
| ENTRY DATE | 09-09-08 |
| PURCHASE DESCRIPTION IDENTIFICATION | 98752-PD09WRGBEC24 |
| PART NAME ASSIGNED BY CONTROLLING AGENCY | TEST SET,SEMICONDUCTOR |