NSN 6625-01-581-4169
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-581-4169 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 990401, 99-0401, TRACKER 2800, MILHDBK300(PME), MIL-HDBK-300(PME), 6625-01-581-4169, 01-581-4169, 6625015814169, 015814169
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | JAN 14, 2010 | 01-581-4169 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-581-4169
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 99-0401 | 57705 | HUNTRON INCDBA HUNTRON INSTRUMENTS |
| TRACKER 2800 | 57705 | HUNTRON INCDBA HUNTRON INSTRUMENTS |
| MIL-HDBK-300(PME) | 1HBK1 | MIL-HDBK-300HQ AFMC-LGIS |
Technical Data | NSN 6625-01-581-4169
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | RESISTANCE, CAPACITANCE, INDUCTANCE |
| OPERATING TEST CAPABILITY | FREQUENCIES 20, 50, 60, 200, 500, AND 2KHZ; VOLTAGES 200MILLI, 3, 5, 10, 15, AND 20V; RESISTANCE 10, 50, 100,500, 1K, 5K, 10K, 50K, 100K OHMS |
| ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| AC VOLTAGE RATING | JA100.0$JA115.0$JA230.0 VOLTS |
| FREQUENCY RATING | E50.0 AND E60.0 |
| PHASE | A |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| DEPTH | 8.500 INCHES NOMINAL |
| HEIGHT | 4.400 INCHES NOMINAL |
| WIDTH | 11.100 INCHES NOMINAL |
| FUNCTIONAL CLASSIFICATION | AA-1.3 |
| FUNCTIONAL DESCRIPTION | USED TO TEST PASSIVE DEVICES, DIODES, TRANSISTORS, GATED DEVICES, OPTOELECTRONIC DEVICES, AND INTEGRATED CIRCUITS |
| RELATIONSHIP TO SIMILAR EQUIPMENT | TRACKER 2800S CAN SCAN MULTI-PIN |
| ENTRY DATE | 10-01-14 |