NSN 6625-01-583-5473

Part Details | SEMICONDUCTOR DEVICE TEST SET

6625-01-583-5473 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Alternate Parts: 990402, 99-0402, TRACKER 2800S, 6625-01-583-5473, 01-583-5473, 6625015835473, 015835473

Supply Group (FSG) NSN Assigned NIIN Item Name Code (INC)
66MAR 29, 201001-583-547325006 ( TEST SET, SEMICONDUCTOR DEVICE )
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-583-5473
Part Number Cage Code Manufacturer
99-040257705HUNTRON INCDBA HUNTRON INSTRUMENTS
TRACKER 2800S57705HUNTRON INCDBA HUNTRON INSTRUMENTS
Technical Data | NSN 6625-01-583-5473
Characteristic Specifications
TEST TYPE FOR WHICH DESIGNEDDEBUG AND TROUBLESHOOTING PROCESS
OPERATING TEST CAPABILITYFREQUENCY(HZ):20,50,60,200,500,2000; CIRCUIT VOLTAGE:200 MILLI,3,5,10,15, AND 20V; RESISTANCE(OHMS):10,50,100,500,1K,5K,10K,50K, AND 100K OHMS
ELECTRICAL POWER SOURCE RELATIONSHIP OPERATING
AC VOLTAGE RATINGJA100.0$JA115.0$JA230.0 VOLTS
FREQUENCY RATINGE50.0 AND E60.0
PHASEA
DC VOLTAGE RATINGV5.0
INCLOSURE FEATURE SINGLE ITEM W/HOUSING
DEPTH8.500 INCHES NOMINAL
HEIGHT4.400 INCHES NOMINAL
LENGTH11.100 INCHES NOMINAL
SPECIAL FEATURESWAVEFORM:SINE WAVE; NUMBER OF SCAN PINS PER CHANNEL:40; SCAN MODES:NAMUAL OR ATOMATIC; WEIGHT:6 LBS